发明名称 METHOD FOR MAINTAINING SUBSTRATE PROCESSING APPARATUS, AND SAFETY APPARATUS FOR SUBSTRATE PROCESSING APPARATUS
摘要 <p>Disclosed is a substrate processing apparatus wherein a drive area (DA1) is partitioned from the peripheral area (SA1) of the drive area with a partitioning section (52), said drive area being covered with a chamber main body section (51), and having disposed therein a drive section that performs predetermined operations so as to process a substrate. Also disclosed is a method for maintaining the substrate processing apparatus, which includes: a first step wherein, prior to opening a first door (DR1) that closes a first opening provided in the chamber main body section (51), an X-ray irradiation apparatus (20) is brought into a state wherein the apparatus cannot radiate x-rays; a second step wherein, after the first door (DR1) is closed but prior to opening a second door (DR2) that closes a second opening provided in the partitioning section (52), the drive section is brought into a state wherein the drive section cannot perform predetermined operations; and a maintenance step wherein the drive section and/or the processing section is maintained, said drive section and/or processing section having been brought into the state wherein the drive section and/or the processing section cannot perform the predetermined operations. Thus, checking by, for instance, observation of the drive state of the drive section, can be safely performed in a chamber.</p>
申请公布号 WO2011074649(A1) 申请公布日期 2011.06.23
申请号 WO2010JP72706 申请日期 2010.12.16
申请人 NIKON CORPORATION;WATANABE, TOMOYUKI;SUZUKI, YASUHIRO;YOKOYAMA, KAZUHIRO 发明人 WATANABE, TOMOYUKI;SUZUKI, YASUHIRO;YOKOYAMA, KAZUHIRO
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址