发明名称 |
TEMPERATURE CONTROL METHOD FOR CHEMICAL VAPOR DEPOSITION DEVICE |
摘要 |
PURPOSE: A temperature control method for a chemical vapor deposition device is provided to precisely the temperature inside a chamber by accurately measuring the temperature distribution of a susceptor. CONSTITUTION: A susceptor(40) has a wafer on top. A heater is arranged inside of the susceptor and heats the wafer. A temperature sensor is arranged inside the chamber and measures the temperature of the susceptor. A rotation indication is arranged with the susceptor at a rotary part. A rotation detection sensor determines the rotation state of the susceptor through the rotation indication. An ID is assigned at a certain temperature period of the susceptor which is calculated by the rotation sensor and temperature sensor. A heater is controlled by comparing a user set temperature period with a reference temperature.
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申请公布号 |
KR20110068374(A) |
申请公布日期 |
2011.06.22 |
申请号 |
KR20090125296 |
申请日期 |
2009.12.16 |
申请人 |
LIGADP CO., LTD. |
发明人 |
HONG, SUNG JAE;LEE, HONG WON;HAN, SEOK MAN;JIN, JOO |
分类号 |
H01L21/205;H01L21/683 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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