PARALLEL TEST CIRCUIT AND METHOD AND SEMICONDUCTOR DEVICE,申请号EP20070831134-传众专利搜索

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发明名称	PARALLEL TEST CIRCUIT AND METHOD AND SEMICONDUCTOR DEVICE
摘要
申请公布号	EP2088442(A4)	申请公布日期	2011.06.22
申请号	EP20070831134	申请日期	2007.11.02
申请人	NEC CORPORATION	发明人	MIZUNO, MASAYUKI
分类号	G11C29/12;G01R31/317	主分类号	G11C29/12
代理机构		代理人
主权项
地址

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