APPARATUS AND METHOD FOR INSPECTING A ELECTRONIC COMPONENT

摘要

PURPOSE: Electronic component inspecting apparatus and method are provided to classify bad electronic components based on the result of an external inspecting process with respect to the electronic component. CONSTITUTION: A pick-up unit(100) picks up an electronic component and rotates. A first vision unit(200) and a second vision unit(300) are adjacently arranged to both lateral sides of the electronic component. The first vision unit and the second vision unit implement an external inspecting process with respect to the four lateral sides of the electronic component through one rotation operation. A first transferring unit(600) and a second transferring unit(700) transfer the first vision unit and the second vision unit.