| 摘要 |
PURPOSE: A raman spectroscope for detecting residual chemical materials on the surface of sample and a raman spectroscopic analysis method using the same are provided to use easily for detecting chemical materials remaining on the surface without damaging sample in a field. CONSTITUTION: A raman spectroscope for detecting residual chemical materials on the surface of sample comprises: a light source generating incident light; a detector receiving scattered light from sample with the incident light and generating signals to indicate the spectrum intensity of a specific wavelength band; an access probe(102) collecting the incident light and putting into the sample, and collecting the scattered light and transmitting to the detector; first light fiber(104) connecting the light source with the access probe; and second light fiber(105) connecting the access probe and the detector.
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