发明名称 Memory device having wide area phase change element and small electrode contact area
摘要 A memory cell device of the type that includes a memory material switchable between electrical property states by application of energy, situated between first and second (“bottom”and“top”) electrodes has a top electrode including a larger body portion and a stem portion. The memory material is disposed as a layer over a bottom electrode layer, and a base of the stem portion of the top electrode is in electrical contact with a small area of the surface of the memory material. Methods for making the memory cell are described.
申请公布号 US7964437(B2) 申请公布日期 2011.06.21
申请号 US20100822569 申请日期 2010.06.24
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG-LAN
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址