发明名称 Optical axis orientation measuring device, optical axis orientation measuring method, spherical surface wave device manufacturing device, and spherical surface wave device manufacturing method
摘要 The optical axis orientation measuring device according to the present invention is a reflective optical axis orientation measuring device for a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: illuminating means for illuminating the spherical member through a polarizer; and isogyre observing means for observing the isogyre that is structured by the light that is reflected from the bottom surface of the spherical member and emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer.
申请公布号 US7965395(B2) 申请公布日期 2011.06.21
申请号 US20090408217 申请日期 2009.03.20
申请人 YAMATAKE CORPORATION 发明人 EBI YUSUKE;SEGAWA SUSUMU
分类号 G01B11/14 主分类号 G01B11/14
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