发明名称 HEATING CONDITION DETERMINATION METHOD AND PROGRAM FOR REFLOW DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a heating condition determination method that allows efficient production by a reflow device configured to heat substrates of different kinds. SOLUTION: The method for determining heating conditions of the reflow device used for a mounting line for producing the substrates of different kinds, includes a first search step (S11) of searching for a first temperature setting meeting temperature profile conditions of all of the substrates of different kind by simulating a temperature profile of a virtual substrate having maximum and minimum thermal characteristic values of the substrates of different kinds when the virtual substrate is carried at a first carrying speed, and a heating condition determination step (S17) of determining heating conditions including carrying of the substrates of different kinds at the first carrying speed with the first temperature setting. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011119466(A) 申请公布日期 2011.06.16
申请号 JP20090275588 申请日期 2009.12.03
申请人 PANASONIC CORP 发明人 TANIGUCHI MASAHIRO;TOMOMATSU MICHINORI;IKEDA MASANORI;OZUMI YOSUKE
分类号 H05K3/34;B23K1/00;B23K1/008;B23K31/02;B23K101/42 主分类号 H05K3/34
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