发明名称 SYSTEMS AND METHODS FOR WEIGH SCALE PERIMETER MONITORING FOR SCANNER-SCALES
摘要 <p>Systems and methods for reducing erroneous weighing of items such as by detecting items (11) extending beyond a periphery of a weigh platter (20, 120, 170, 240) whereby in one configuration, the system employs a light guide (30, 320) for routing a light beam to a detector (40,140) operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap (252, 257) between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector (280). Various indicators (295, 297) for alerting the operator of off-scale detection are also described.</p>
申请公布号 WO2011071731(A2) 申请公布日期 2011.06.16
申请号 WO2010US58604 申请日期 2010.12.01
申请人 DATALOGIC SCANNING, INC.;MCQUEEN, ALEXANDER M.;O'DONNELL, PATRICK M. 发明人 MCQUEEN, ALEXANDER M.;O'DONNELL, PATRICK M.
分类号 G06K7/10 主分类号 G06K7/10
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