发明名称 WAFER CLEANING APPARATUS WITH SPIN SCRUBBER AND CLEANING METHOD THEREOF
摘要 PURPOSE: A wafer cleaning device by a spin scrubber and cleaning method using the same are provided to have a double-side cleaning chamber which simultaneously cleans front and back sides, thereby reducing cleaning time. CONSTITUTION: A clamping member(610) contacts an edge of a wafer(20) to vertically support the wafer. A frontal nozzle unit includes a first nozzle(621) and a first transfer shaft(622). Cleaning liquid is sprayed onto the frontal side of the wafer supported by the clamping member. The first transfer shaft supports the first nozzle. A back nozzle unit(630) includes a second nozzle(631) and a second transfer shaft(632). Cleaning liquid is sprayed onto the back side of the wafer supported by the clamping member. The second transfer shaft supports the second nozzle.
申请公布号 KR20110064608(A) 申请公布日期 2011.06.15
申请号 KR20090121288 申请日期 2009.12.08
申请人 DONGBU HITEK CO., LTD. 发明人 KIM, YUN KYUNG
分类号 H01L21/304 主分类号 H01L21/304
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