发明名称 Method for fabricating thermal compliant semiconductor chip wiring structure for chip scale packaging
摘要 A new method to form an integrated circuit device is achieved. The method comprises providing a substrate. A sacrificial layer is formed overlying the substrate. The sacrificial layer is patterned to form temporary vertical spacers where conductive bonding locations are planned. A conductive layer is deposited overlying the temporary vertical spacers and the substrate. The conductive layer is patterned to form conductive bonding locations overlying the temporary vertical spacers. The temporary vertical spacers are etched away to create voids underlying the conductive bonding locations.
申请公布号 US7960272(B2) 申请公布日期 2011.06.14
申请号 US20070761360 申请日期 2007.06.11
申请人 MEGICA CORPORATION 发明人 LEE JIN-YUAN;LIN SHIH-HSIUNG
分类号 H01L21/44;H01L21/60;H01L23/31;H01L23/485 主分类号 H01L21/44
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