发明名称 Semiconductor device and method of manufacturing the same
摘要 A method includes burying a conductive pattern in an insulating film made of SiOH, SiCOH or organic polymer, treating surfaces of the insulating film and the conductive pattern with plasma which includes a hydrocarbon gas as a treatment gas, and forming a diffusion barrier film, which is formed of an SiCH film, an SiCHN film, an SiCHO film or an SiCHON film, over the insulating film and the conductive pattern with performing a plasma CVD by adding an Si-containing gas to the treatment gas while increasing an addition amount gradually or in a step by step manner.
申请公布号 US7956467(B2) 申请公布日期 2011.06.07
申请号 US20090591193 申请日期 2009.11.12
申请人 RENESAS ELECTRONICS CORPORATION 发明人 USAMI TATSUYA
分类号 H01L23/48 主分类号 H01L23/48
代理机构 代理人
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