发明名称 Method and apparatus for generating temperature-compensated read and verify operations in flash memories
摘要 Methods and an apparatuses for generating a word-line voltage are disclosed. A word-line voltage generator includes a first current source, an adjustable current source, adjustable current sink, and a voltage converter, all operably coupled to a current sum node. The first current source generates a first current having a temperature coefficient substantially equal to a temperature coefficient of at least one-bit cell. The adjustable current source generates a second current that is substantially independent of a temperature change. The adjustable current sink sinks a third current that is substantially independent of a temperature change. The voltage converter is configured for generating a word-line signal having a word-line voltage proportional to a reference current, wherein the reference current comprises the first current, plus the second current, and minus the third current.
申请公布号 US7957215(B2) 申请公布日期 2011.06.07
申请号 US20070866264 申请日期 2007.10.02
申请人 MICRON TECHNOLOGY, INC. 发明人 TANZAWA TORU
分类号 G11C8/00;G11C11/34 主分类号 G11C8/00
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