发明名称 PHASE CHANGE MEMORY DEVICE CAPABLE OF REDUCTION DISTURBANCE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A phase change memory device and a manufacturing method thereof are provided to extend the effective length between heating electrodes by forming a curved part on an interlayer insulation layer between the heating electrodes extended in one bit line. CONSTITUTION: A plurality of word lines(110) are parallel extended with a preset space. A plurality of heating electrodes(140) are electrically connected to the word line. An interlayer insulation layer(130) insulates the heating electrodes. A plurality of phase change lines(150) are electrically connected to the heating electrodes. A curved part is formed on the surface of the interlayer insulation layer between the word lines.</p>
申请公布号 KR101038997(B1) 申请公布日期 2011.06.03
申请号 KR20090128786 申请日期 2009.12.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JANG UK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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