发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device of a novel structure. <P>SOLUTION: The semiconductor device includes a first transistor having a channel forming region disposed on a semiconductor material-containing substrate, an impurity region formed to nip the channel forming region, a first gate insulating layer on the channel forming region, a first gate electrode on the first gate insulating layer, and a first source electrode and a first drain electrode electrically connected with the impurity region; and a second transistor having a second gate electrode on a semiconductor material-containing substrate, a second gate insulating layer on the second gate electrode, an oxide semiconductor layer on the second gate insulating layer, and a second source electrode and a second drain electrode electrically connected with the oxide semiconductor layer. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011109079(A) 申请公布日期 2011.06.02
申请号 JP20100234811 申请日期 2010.10.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;KOYAMA JUN;IMAI KEITARO
分类号 H01L27/092;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/08;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L27/092
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