发明名称 FERROELECTRIC MEMORY, AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a ferroelectric memory that achieves low-temperature heat treatment in a manufacturing process while preventing degradation of memory characteristics due to shortage of heat treatment of baking densification to crystallize a ferroelectric film, especially degradation of residual polarization characteristics of the ferroelectric film. SOLUTION: The ferroelectric memory includes a ferroelectric capacitor on which a lower electrode 10, capacitance insulation film 12 composed of the ferroelectric film with a perovskite-type crystal structure, and an upper electrode 13 are formed to be laminated in this order on a p-type semiconductor substrate 1. Furthermore, the memory includes a convex lens 14 that is formed on the upper electrode 13 to selectively heat the ferroelectric film by concentrating light. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011108828(A) 申请公布日期 2011.06.02
申请号 JP20090262029 申请日期 2009.11.17
申请人 PANASONIC CORP 发明人 TATSUNARI TOSHITAKA
分类号 H01L27/105;H01L21/8246;H01L27/10 主分类号 H01L27/105
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