| 摘要 |
A test apparatus includes a recovered clock generating circuit generating a recovered clock having substantially the same phase as an output of a device under test (DUT), a data acquiring section acquiring a value of the output data at a timing indicated by a strobe signal based on the recovered clock, a comparator comparing the value acquired by the data acquiring section to a prescribed expected value, and a judging section judging pass/fail of the DUT based on a comparison result. The recovered clock generating circuit includes a phase comparator comparing the phase of the output data of the DUT to the phase of the recovered clock, a control signal generating section generating a control signal such that the phase of the recovered clock is synchronized with the phase of the output data, and a phase shifter continuously shifting the phase of the reference clock based on the control signal. |
