| 摘要 |
<p>A particle Analyzing apparatus, comprising: a flow cell which forms a specimen flow including particles; first and second light sources; an irradiation optical system which applies lights emitted from the first and second light sources so that the lights are applied to the specimen flow; a detector which detects forward scattered light, the forward scattered light being emitted from the first light and scattered by the particle in the specimen flow, and generates a signal according to the detected scattered light; a light blocking member disposed between the flow cell and the detector; a controller which obtains characteristic parameters of the particle based on the signal from the detector; and an imaging device which captures an image of the particle in the specimen flow using the light from the second light source is disclosed. Particle imaging method is also disclosed.</p> |
