发明名称 On die thermal sensor of semiconductor memory device and method thereof
摘要 An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a trimming code by comparing the first comparing voltage with a second comparing voltage and increasing or decreasing a preset digital code in response to the comparing result; and a voltage level adjusting unit for adjusting a voltage level of the second comparing voltage by determining a maximum variation voltage and a minimum variation voltage based on the trimming code and a temperature control code.
申请公布号 US7953569(B2) 申请公布日期 2011.05.31
申请号 US20080290034 申请日期 2008.10.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG CHUN-SEOK
分类号 G01K15/00;G01K7/01;G01K13/00;G01R31/26;G06F19/00;G11C11/406;H01L21/8242;H01L27/108 主分类号 G01K15/00
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