发明名称 Dual-bit memory device having trench isolation material disposed near bit line contact areas
摘要 A dual-bit memory device is provided which includes trench isolation material disposed near bit line contact areas. For example, in one implementation a semiconductor memory device is provided in which each memory cell can store two bits of information. The memory device comprises a substrate, first and second buried bit lines in the substrate, a first bit line contact on the first buried bit line, a second bit line contact on the second buried bit line, and an insulator region disposed in the substrate between the first buried bit line and the second buried bit line. The insulator region prevents a current from flowing between the first buried bit line and the second buried bit line.
申请公布号 US7948052(B2) 申请公布日期 2011.05.24
申请号 US20060612413 申请日期 2006.12.18
申请人 SPANSION LLC 发明人 ZHENG WEI
分类号 H01L27/10 主分类号 H01L27/10
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