发明名称 |
Microelectronic device and pin arrangement method thereof |
摘要 |
The present invention provides a microelectronic device with a circuit core and a boundary scan test interface sharing a number of pre-selected pins. In the mode of a boundary scan test, the boundary scan test interface manipulates the input and output of the test signal through the shared pins. Pins necessary for the microelectronic device are therefore reduced.
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申请公布号 |
US7949919(B2) |
申请公布日期 |
2011.05.24 |
申请号 |
US20080287831 |
申请日期 |
2008.10.14 |
申请人 |
REALTEK SEMICONDUCTOR CORP. |
发明人 |
WU HSIANG-HUANG;LI MING-JE;LEE JIH-NUNG |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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