发明名称 |
CHEMICAL-MECHANICAL POLISHING LIQUID, AND SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND POLISHING METHOD USING SAID POLISHING LIQUID |
摘要 |
<p>Provided is a chemical-mechanical polishing liquid that contains: cerium oxide particles; an organic compound that has acetylenic bonds; and water. Said organic compound that has acetylenic bonds constitutes between 0.00001% and 0.01% of the mass of the entire chemical-mechanical polishing liquid. Also provided is a chemical-mechanical polishing liquid that contains: cerium oxide particles; an organic compound that has acetylenic bonds; either an anionic macromolecular compound obtained by polymerizing a composition that contains a monomer component which is a vinyl compound that has an anionic substituent, or a salt thereof; and water. Said organic compound that has acetylenic bonds constitutes at least 0.000001% and less than 0.05% of the mass of the entire chemical-mechanical polishing liquid.</p> |
申请公布号 |
WO2011058816(A1) |
申请公布日期 |
2011.05.19 |
申请号 |
WO2010JP65863 |
申请日期 |
2010.09.14 |
申请人 |
HITACHI CHEMICAL COMPANY, LTD.;YOSHIKAWA, SHIGERU;AKUTSU, TOSHIAKI;FUKASAWA, MASATO |
发明人 |
YOSHIKAWA, SHIGERU;AKUTSU, TOSHIAKI;FUKASAWA, MASATO |
分类号 |
H01L21/304;B24B37/04;C09K3/14 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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