发明名称 CHEMICAL-MECHANICAL POLISHING LIQUID, AND SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD AND POLISHING METHOD USING SAID POLISHING LIQUID
摘要 <p>Provided is a chemical-mechanical polishing liquid that contains: cerium oxide particles; an organic compound that has acetylenic bonds; and water. Said organic compound that has acetylenic bonds constitutes between 0.00001% and 0.01% of the mass of the entire chemical-mechanical polishing liquid. Also provided is a chemical-mechanical polishing liquid that contains: cerium oxide particles; an organic compound that has acetylenic bonds; either an anionic macromolecular compound obtained by polymerizing a composition that contains a monomer component which is a vinyl compound that has an anionic substituent, or a salt thereof; and water. Said organic compound that has acetylenic bonds constitutes at least 0.000001% and less than 0.05% of the mass of the entire chemical-mechanical polishing liquid.</p>
申请公布号 WO2011058816(A1) 申请公布日期 2011.05.19
申请号 WO2010JP65863 申请日期 2010.09.14
申请人 HITACHI CHEMICAL COMPANY, LTD.;YOSHIKAWA, SHIGERU;AKUTSU, TOSHIAKI;FUKASAWA, MASATO 发明人 YOSHIKAWA, SHIGERU;AKUTSU, TOSHIAKI;FUKASAWA, MASATO
分类号 H01L21/304;B24B37/04;C09K3/14 主分类号 H01L21/304
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