APPARATUS AND METHOD FOR COMPONENTIAL ANALYSIS USING X-RAY

摘要

PURPOSE: A device and method for componential analysis using x-ray are provided to measure the composition rate of similar components comprising object. CONSTITUTION: A device for componential analysis using x-ray comprises an X-ray taking part(120), a component ratio estimator(112), a length calculation unit(114) and an error confirmation unit(116). The X-ray taking part outputs the X-ray image of an object using X-ray of more than two energy bands. The component ratio estimator predicts the component ratio of object by using X-ray images. The length calculation unit calculates the length of the object per each energy band using the intensity of X-ray image, if the object is composed of the estimated component ratio. The error confirmation unit compares the length of the object especially calculated according to each energy band in order to confirm the error of the component ratio.