| 摘要 |
A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.
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