| 摘要 |
PROBLEM TO BE SOLVED: To provide a cooling structure of an in-circuit test fixture which has sufficient cooling capability and miniaturizes a heat sink. SOLUTION: While forming a vacuum in a test space 20, the in-circuit test fixture performs a circuit test by bringing probes 13 and 14 into contact with a circuit board S placed between probe plates 11 and 12, wherein it is characterized in that a cover 15 incorporating the heat sink 18 for cooling a device D is mounted on the probe plate 11 and an inlet 19 for taking in air is arranged in the cover 15. COPYRIGHT: (C)2011,JPO&INPIT |
