发明名称 |
HEAT TREATMENT APPARATUS, HEAT TREATMENT METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a heat treatment apparatus in which a large-sized substrate can be rapidly heated and rapidly cooled with high uniformity, and to provide a heat treatment method using the heat treatment apparatus. <P>SOLUTION: The heat treatment apparatus includes: a first chamber of which one side is opened; a second chamber of which one side is opened; a device for moving the first and second chambers; a heating device; a gas introduction port; a gas exhaust port; and a tool for longitudinally fixing a substrate, wherein the substrate is rapidly heated while the first and second chambers are connected, and rapidly cooled using a temperature difference from the outside of the chambers while separating the first and second chambers to move a heat storage portion of the heating device or the like away from the substrate. Further, the heat treatment method uses the heat treatment apparatus, and a method for manufacturing the semiconductor device using an oxide semiconductor is included. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011091386(A) |
申请公布日期 |
2011.05.06 |
申请号 |
JP20100212294 |
申请日期 |
2010.09.22 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
NARITA AKIHIRO;ONUMA HIDETO;MORIWAKA TOMOAKI;YAMAZAKI SHUNPEI |
分类号 |
H01L21/26;H01L21/324;H01L21/336;H01L29/786 |
主分类号 |
H01L21/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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