发明名称 PROBE SHEET CAPABLE OF COMPLETELY CONTACTING A PROBE TERMINAL WITH A TERMINAL OF AN ELECTRONIC CIRCUIT TO BE MEASURED
摘要 PURPOSE: A probe sheet is provided to increase the location accuracy and stability of a probe terminal while eliminating the location mismatch between a terminal of an electronic circuit to be measured and a probe terminal. CONSTITUTION: A support substrate(12) is made of a material with the same thermal expansion coefficient as a material(22) of an electronic circuit to be measured. An elastic layer(14) is laminated on the support substrate. A resin layer(16) is laminated on the elastic layer. A plurality of probe terminals(18) is electrically contact a plurality of terminals(20A) respectively. A plurality of terminals is arranged on the electronic circuit.
申请公布号 KR20110046286(A) 申请公布日期 2011.05.04
申请号 KR20100102176 申请日期 2010.10.20
申请人 发明人
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址