发明名称 CURRENT MEASURING MODULE IN TEST-APPARATUS FOR TESTING POWER SEMICONDUCTOR MODULE
摘要 PURPOSE: A current measuring module in an apparatus for testing a power semiconductor module is provided to reduce parasitic inductance caused by connection lines, thereby accurately measuring currents flowing in a busbar. CONSTITUTION: A first current transformer comprises a first ring shaped core(610) and a first coil(620). A first busbar(402) passes the first ring shaped core. A first connection line(630) is connected to both ends of the first coil. The second current transformer(750) comprises a second ring shaped core. The second current transformer detects currents outputted from the first current transformer.
申请公布号 KR20110045405(A) 申请公布日期 2011.05.04
申请号 KR20090101969 申请日期 2009.10.26
申请人 发明人
分类号 H01L21/66;G01R1/04;G01R19/02 主分类号 H01L21/66
代理机构 代理人
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