发明名称 COLOR-UNEVENNESS INSPECTION APPARATUS AND METHOD
摘要 A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup section, and by classifying unit regions included in each of the uneven-color regions into a plurality of color groups; a calculation section calculating, on the uneven-color regions in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; a correction section making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups; and an inspection section performing the color-unevenness inspection, based on a resultant evaluation parameter obtained by the correction.
申请公布号 US2011096191(A1) 申请公布日期 2011.04.28
申请号 US20100906646 申请日期 2010.10.18
申请人 SONY CORPORATION 发明人 NAGAMINE KUNIHIKO;TOMIOKA SATOSHI
分类号 H04N9/73;G06K9/00 主分类号 H04N9/73
代理机构 代理人
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