发明名称 MOS TRANSISTOR WITH ELEVATED GATE DRAIN CAPACITY
摘要 A MOS transistor having an increased gate-drain capacitance is described. One embodiment provides a drift zone of a first conduction type. At least one transistor cell has a body zone, a source zone separated from the drift zone by the body zone, and a gate electrode, which is arranged adjacent to the body zone and which is dielectrically insulated from the body zone by a gate dielectric. At least one compensation zone of the first conduction type is arranged in the drift zone. At least one feedback electrode is arranged at a distance from the body zone, which is dielectrically insulated from the drift zone by a feedback dielectric and which is electrically conductively connected to the gate electrode.
申请公布号 US2011089481(A1) 申请公布日期 2011.04.21
申请号 US20100976107 申请日期 2010.12.22
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 WILLMEROTH ARMIN;TREU MICHAEL
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
主权项
地址