发明名称 |
X-RAY SOURCE, AND FLUORESCENT X-RAY ANALYZING DEVICE |
摘要 |
The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target (119) is arranged in superposition on a primary target (118). An electron beam (115) generated by an electron gun (114) enters the primary target (118), which passes and emits a continuous X-ray. The secondary target (119) transmits and emits a characteristic X-ray (121) excited by the continuous X-ray emitted from the primary target (118). The primary target (118) and the secondary target (119) are superposed one on the other, so that the continuous X-ray emitted from the primary target (118) efficiently excites the secondary target (119) thereby to efficiently generate the characteristic X-ray (121). |
申请公布号 |
EP1988564(A4) |
申请公布日期 |
2011.04.20 |
申请号 |
EP20070707896 |
申请日期 |
2007.02.01 |
申请人 |
TOSHIBA ELECTRON TUBES & DEVICES CO., LTD. |
发明人 |
AOKI, NOBUTADA;KAKUTANI, AKIKO |
分类号 |
H01J35/08;G01N23/223;H01J35/10;H01J35/18;H01J35/26 |
主分类号 |
H01J35/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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