发明名称 X-RAY SOURCE, AND FLUORESCENT X-RAY ANALYZING DEVICE
摘要 The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target (119) is arranged in superposition on a primary target (118). An electron beam (115) generated by an electron gun (114) enters the primary target (118), which passes and emits a continuous X-ray. The secondary target (119) transmits and emits a characteristic X-ray (121) excited by the continuous X-ray emitted from the primary target (118). The primary target (118) and the secondary target (119) are superposed one on the other, so that the continuous X-ray emitted from the primary target (118) efficiently excites the secondary target (119) thereby to efficiently generate the characteristic X-ray (121).
申请公布号 EP1988564(A4) 申请公布日期 2011.04.20
申请号 EP20070707896 申请日期 2007.02.01
申请人 TOSHIBA ELECTRON TUBES & DEVICES CO., LTD. 发明人 AOKI, NOBUTADA;KAKUTANI, AKIKO
分类号 H01J35/08;G01N23/223;H01J35/10;H01J35/18;H01J35/26 主分类号 H01J35/08
代理机构 代理人
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