发明名称 CHEMICAL MECHANICAL POLISHING PAD HAVING WAVE-SHAPED GROOVES
摘要 <p>Disclosed is a chemical mechanical polishing pad formed at a polishing surface thereof with a plurality of concentric wave-shaped grooves having different radiuses while having the same shape. Each groove has a desired depth, width, and shape. The chemical mechanical polishing pad provides effects of effectively controlling a flow of slurry during a polishing process, thereby achieving a stability in the polishing process in terms of a polishing rate, and achieving an enhancement in the planarization of a wafer.</p>
申请公布号 EP1433197(B1) 申请公布日期 2011.04.20
申请号 EP20010965710 申请日期 2001.08.29
申请人 SKC CO., LTD. 发明人 PARK, IN-HA;KIM, JAE-SEOK;HWANG, IN-JU;KWON, TAE-KYOUNG
分类号 B24B37/00;H01L21/304;B24B37/04;B24D13/14;H01L21/306 主分类号 B24B37/00
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