发明名称 TESTING OF LEDS
摘要 A method of determining the ageing characteristics of an LED comprises applying a current stress pulse to the LED. The LED is monitored to determine when the thermal heating induced by the current stress pulse has been dissipated to a desired level. The operational characteristics of the LED are then measured before applying the next stressing pulse. This method accelerates the effect of aging in a reproducible way and therefore is able to greatly reduce the time needed for a reliability test.
申请公布号 US2011084701(A1) 申请公布日期 2011.04.14
申请号 US20100876075 申请日期 2010.09.03
申请人 NXP B.V. 发明人 BANCKEN PASCAL;NGUYEN HOANG VIET;SURDEANU RADU
分类号 G01R31/00 主分类号 G01R31/00
代理机构 代理人
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