发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device formation method is provided to improve the characteristic of the semiconductor device by fundamentally solving the problem that the bottom of the contact hole is not open. CONSTITUTION: A bottom metal layer(110) is formed on a semiconductor substrate. A sacrificial dielectric film(130) is formed on the upper part of the bottom metal layer. The first contact hole is formed on the sacrificial dielectric film. An insulation spacer(160) is formed on the sidewall of the first contact hole.
申请公布号 KR20110037242(A) 申请公布日期 2011.04.13
申请号 KR20090094599 申请日期 2009.10.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOU, MI HYUNE;KIM, JAE YOUNG
分类号 H01L21/28 主分类号 H01L21/28
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