发明名称 DATA DRIVING IMPEDANCE AUTO CALIBRATION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT USING THE SAME
摘要 PURPOSE: A data driving impedance auto calibration circuit and a semiconductor integrated circuit using the same are provided to improve a data output property by maintaining data driving impedance. CONSTITUTION: In a data driving impedance auto calibration circuit and a semiconductor integrated circuit using the same, a detection block(500) detects the change of a motion property. The detection block adjusts a specific voltage according to a code signal. The detection block generates a control property voltage. A comparison block(700) compares a reference voltage with the control property voltage. The comparison block outputs a compare result signal. The code adjusting block(900) adjusts the code signal.
申请公布号 KR101027689(B1) 申请公布日期 2011.04.12
申请号 KR20090093597 申请日期 2009.09.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG, WON KYUNG
分类号 G11C7/10;G11C5/14 主分类号 G11C7/10
代理机构 代理人
主权项
地址