发明名称 CRYSTAL LATTICE MOIRE PATTERN ACQUISITION METHOD AND SCANNING MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To highly accurately obtain a Moire pattern similar to a crystal lattice image in a short time. SOLUTION: A method for obtaining a crystal lattice Moire pattern of a crystal structure through the use of a scanning microscope includes the process for periodically arranging a plurality of virtual lattice points in a scanning surface of the crystal structure according to the crystal structure and orientation, the process for detecting signals from the plurality of virtual lattice points through the use of an incidence probe, and the process for generating a crystal lattice Moire pattern of the crystal structure on the basis of detected signals. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011069734(A) 申请公布日期 2011.04.07
申请号 JP20090221317 申请日期 2009.09.25
申请人 TOSHIBA CORP 发明人 TANAKA HIROTAKE
分类号 G01N23/04;G01B15/06;G01N23/225;H01J37/28 主分类号 G01N23/04
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