| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe card which enables to use probe pins in the shape of a horizontal type cantilever on the occasion of performing continuity inspection of an integrated circuit having a plurality of electrodes arranged in grid disposition, and a method for manufacturing the same. SOLUTION: In this probe card 1, a plurality of probe pins 3 contacting respectively with the electrodes 11 arranged in the grid disposition on the integrated circuit 10 are provided on a wiring board 2. The probe pins 3 in a plurality are formed respectively in the shape of the horizontal type cantilever and disposed aslant to both of two-dimensional directions (direction X and direction Y) in the grid disposition of the electrodes 11. COPYRIGHT: (C)2011,JPO&INPIT
|
