发明名称 MEMORY SYSTEMS AND METHODS OF DETECTING DISTRIBUTION OF UNSTABLE MEMORY CELLS
摘要 A circuit is operated to detect unstable memory cells from among a plurality of memory cells in at least one page. A determination is made from an initial status of data stored in a memory cell whether no read error occurs when the data is read at a standard read voltage level, whether a read error occurs and the read error is correctable, and whether a read error occurs and the read error is uncorrectable. Responsive to determining that a read error occurs that is correctable, a further determination is made as to whether the memory cell is correctable by reading the data stored in the memory cell at a correction read voltage level, which has a different voltage level from the standard read voltage level, and by determining whether a read error occurring in the data read at the correction read voltage level is correctable or uncorrectable.
申请公布号 US2011083039(A1) 申请公布日期 2011.04.07
申请号 US20100774340 申请日期 2010.05.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SEON-TAEK;KYUNG YOON-YOUNG
分类号 G06F11/28;G06F11/00;G06F11/10;H03M13/05 主分类号 G06F11/28
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