发明名称 TESTING DEVICE OF CIRCUIT BOARD, AND RESISTANCE MEASURING METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a resistance measuring method capable of measuring a resistance easily by using a probe pin for resistance measurement even in the case of a small-sized narrow connector. SOLUTION: A first substrate 10 and a second substrate 20 for mounting connector terminals thereon are used, which include respectively many tuning-fork type electrodes each constituted of a forked electrode and a land extending from a connection part to the opposite direction to the forked electrode, and connectors C10, C20 are mounted on each substrate, and then a flat cable 30 is mounted on each connector C10, C20. Instead of allowing the probe pin for resistance measurement to abut on an electrode to be measured, the probe pin for resistance measurement is allowed to abut on one in a land group 10L on the first substrate 10 connected to the electrode to be measured, and similarly, instead of allowing the probe pin for resistance measurement to abut on the other electrode to be measured, the probe pin for resistance measurement is allowed to abut on one in a land group 20L on the second substrate 20 connected to the electrode to be measured, to thereby measure its electric resistance value. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011064506(A) 申请公布日期 2011.03.31
申请号 JP20090213563 申请日期 2009.09.15
申请人 YAZAKI CORP 发明人 OYAMA KOICHI
分类号 G01R31/02;G01R31/28;H05K1/02;H05K1/14;H05K3/00;H05K3/36 主分类号 G01R31/02
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