| 摘要 |
PROBLEM TO BE SOLVED: To provide an array substrate and an inspection method, efficiently finding a defect in a manufacturing stage by adding minimum inspection circuits, and preventing depression as a completed article after the end of inspection. SOLUTION: In this inspection circuit and its method, an FPD array substrate contains a simple inspection circuit including a sense amplifier disposed in every data line, after writing data, data is read from a pixel, amplified by the sense amplifier, and retained. The data is compared with an expected value to detect pixel failure, and the defective part is determined at high speed. COPYRIGHT: (C)2011,JPO&INPIT
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