发明名称 FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION METHOD
摘要 A foreign-matter inspection apparatus is implemented which allows the stable detection sensitivity to be maintained. A laser beam emitted from a laser apparatus is applied to a beam irradiation sample via an irradiation unit and a mirror. Then, the laser beam is captured into a beam-capturing camera via an image-forming lens and a beam-direction switching mirror. Based on the captured beam image, an image computational processing unit judges inclination of the laser beam, then adjusting the irradiation unit thereby to correct the inclination of the laser beam. Also, the beam is captured into the beam-capturing camera in specified number-of-times while focus of the laser beam is being changed by an arbitrary amount by the irradiation unit. Based on the captured beam, the focus of the laser beam is corrected by adjusting the irradiation unit.
申请公布号 US2011075136(A1) 申请公布日期 2011.03.31
申请号 US20100965393 申请日期 2010.12.10
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 BAMBA YOSHIO;OCHI MASAYUKI;NOZAWA SHIGEHISA
分类号 G01N21/00 主分类号 G01N21/00
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