发明名称 METHOD FOR MANUFACTURING BODY CONTAINING SEMICONDUCTOR MATERIAL HAVING REDUCED MEAN FREE PATH LENGTH, AND THE BODY MANUFACTURED USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a body (1) containing doped semiconductor material having a specific mean free path length (&lambda;n) for free charge carriers (CP), and a mean free path length (&lambda;r) for the free charge carriers (CP) smaller than the specific mean free path length (&lambda;n). <P>SOLUTION: In this method, an epitaxial crystal layer (20) containing doped semiconductor material is produced on a substrate crystal (10) containing semiconductor material having the specific mean free path length (&lambda;n). The epitaxial crystal layer has, at least locally, a mean free path length (&lambda;r) for the free charge carriers (CP) smaller than the specific mean free path length (&lambda;n). The body (1) can be manufactured by joining two crystal bodies (10', 10'') containing doped semiconductor material to each other. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011061226(A) 申请公布日期 2011.03.24
申请号 JP20100246899 申请日期 2010.11.02
申请人 EUPEC GES FUER LEISTUNGSHALBLEITER MBH & CO KG 发明人 KARTAL VELI;SCHULZE HANS-JOACHIM
分类号 H01L21/20;H01L21/329;H01L21/02;H01L21/322;H01L29/32;H01L29/36;H01L29/861 主分类号 H01L21/20
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