发明名称 |
METHOD FOR MANUFACTURING BODY CONTAINING SEMICONDUCTOR MATERIAL HAVING REDUCED MEAN FREE PATH LENGTH, AND THE BODY MANUFACTURED USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a body (1) containing doped semiconductor material having a specific mean free path length (λn) for free charge carriers (CP), and a mean free path length (λr) for the free charge carriers (CP) smaller than the specific mean free path length (λn). <P>SOLUTION: In this method, an epitaxial crystal layer (20) containing doped semiconductor material is produced on a substrate crystal (10) containing semiconductor material having the specific mean free path length (λn). The epitaxial crystal layer has, at least locally, a mean free path length (λr) for the free charge carriers (CP) smaller than the specific mean free path length (λn). The body (1) can be manufactured by joining two crystal bodies (10', 10'') containing doped semiconductor material to each other. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011061226(A) |
申请公布日期 |
2011.03.24 |
申请号 |
JP20100246899 |
申请日期 |
2010.11.02 |
申请人 |
EUPEC GES FUER LEISTUNGSHALBLEITER MBH & CO KG |
发明人 |
KARTAL VELI;SCHULZE HANS-JOACHIM |
分类号 |
H01L21/20;H01L21/329;H01L21/02;H01L21/322;H01L29/32;H01L29/36;H01L29/861 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|