发明名称 Bumpless wafer scale device and board assembly
摘要 A semiconductor chip having a planar active surface including an integrated circuit; the circuit has metallization patterns including a plurality of contact pads. Each of these contact pads has an added conductive layer on the circuit metallization. This added layer has a conformal surface adjacent the chip and a planar outer surface, and this outer surface is suitable to form metallurgical bonds without melting. The chip contact pads may have a distribution such that an area portion of the active chip surface is available for attaching a thermally conductive plate; this plate has a thickness compatible with the thickness of the conductive pad layer.
申请公布号 US7910471(B2) 申请公布日期 2011.03.22
申请号 US20040769699 申请日期 2004.02.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 ZUNIGA-ORTIZ EDGAR R.;KODURI SREENIVASAN K.
分类号 H01L21/44;H01L23/485 主分类号 H01L21/44
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