发明名称 Methods for measuring dielectric properties of parts
摘要 A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.
申请公布号 US7911213(B2) 申请公布日期 2011.03.22
申请号 US20080240375 申请日期 2008.09.29
申请人 LAM RESEARCH CORPORATION 发明人 KIM JAEHYUN;SATO ARTHUR H.;COMENDANT KEITH;LIU QING;WU FEIYANG
分类号 G01R27/26 主分类号 G01R27/26
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