| 摘要 |
A clock signal generation apparatus includes a clock signal generation circuit generating a plurality of clock signals, and a self-test circuit measuring a phase difference of one pair of clock signals. The self-test circuit includes a clock signal selection circuit selecting the pair of clock signals among the plurality of clock signals, a phase detection circuit generating a phase difference pulse signal, a test signal generation circuit generating a test signal having a frequency which is lower than the phase difference pulse signal, and a counter circuit counting the pulse number of the test signal.
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