| 发明名称 |
Method for determining a length of shielding of a semiconductor integrated circuit wiring |
| 摘要 |
A semiconductor integrated circuit includes a shielded wire line and a shielding wire line provided for the shielded wire line and divided into a plurality of segments in a longitudinal direction of the shielded wire line.
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| 申请公布号 |
US7913212(B2) |
申请公布日期 |
2011.03.22 |
| 申请号 |
US20080071845 |
申请日期 |
2008.02.27 |
| 申请人 |
FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
USHIYAMA KENICHI;ICHINOSE SHIGENORI |
| 分类号 |
G06F9/455;G06F17/50;H01L21/82;H01L21/822;H01L23/522;H01L27/04 |
主分类号 |
G06F9/455 |
| 代理机构 |
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