发明名称 PHOTOSENSITIVE COMPOUND AND PHOTOSENSITIVE COMPOSITION INCLUDING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive compound that has excellent sensitivity and also improves residual film ratio characteristics, and to provide a photosensitive composition including the photosensitive compound that improves perpendicularity of a pattern created after a semiconductor photolithography process. <P>SOLUTION: The photosensitive compound contains a naphthoquinonediazide sulfonic acid ester compound having at least one naphthoquinonediazide sulfoxy group (-ODNQ), and having either at least one carboxyl group or alkoxy group having 1 to 8 carbon atoms, in one molecule. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011053639(A) 申请公布日期 2011.03.17
申请号 JP20100012846 申请日期 2010.01.25
申请人 KOREA KUMHO PETROCHEMICAL CO LTD 发明人 PARK JOO HYEON;KANG SEOK CHAN;CHO JUNG HWAN;SON KYUNG CHUL
分类号 G03F7/022;G03F7/023;H01L21/027 主分类号 G03F7/022
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