| 摘要 |
<p>Disclosed is a strain measuring device that is capable of stable measurement and is not influenced by changes in the illuminance and irradiation direction of light received by an object to be measured (5). A computer (4) functions as a micro region extracting means for extracting the surface height distribution of micro regions (a, b), which each include points (A, B) in a prescribed region (6) of the object to be measured (5), from an initial height distribution that was obtained by measuring the prescribed region (6) with a surface height measuring apparatus (2); a coordinate calculating means for calculating the post-time lapse surface height distribution coordinates of points (A', B') in the prescribed region (6) that are within micro regions (a', b') in the closest proximity to the aforementioned micro regions (a, b) and correspond to the aforementioned points (A, B) in the aforementioned micro regions (a, b); and a strain calculating means for calculating the strain in the line segment (AB) direction of the object to be measured (5).</p> |
