发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having achieved formation of a capacitor insulating film having high permittivity and stable in a high-temperature condition. SOLUTION: This method of manufacturing the semiconductor device includes: a first process of forming an amorphous first insulating film containing a first element on a substrate; a second process of adding a second element different from the first element to the first insulating film to form an amorphous second insulating film on the substrate; and a third process of annealing the second insulating film at a predetermined annealing temperature to be subjected to phase transition into a third insulating film. The addition concentration of the second element is controlled according to the annealing temperature. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011049531(A) 申请公布日期 2011.03.10
申请号 JP20100146099 申请日期 2010.06.28
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TAKEBAYASHI YUJI;YAMAZAKI HIROHISA;HORII SADAYOSHI;ITAYA HIDEJI;OGAWA ARIHITO
分类号 H01L21/316;H01L21/31;H01L21/8242;H01L27/108 主分类号 H01L21/316
代理机构 代理人
主权项
地址
您可能感兴趣的专利