发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having achieved formation of a capacitor insulating film having high permittivity and stable in a high-temperature condition. SOLUTION: This method of manufacturing the semiconductor device includes: a first process of forming an amorphous first insulating film containing a first element on a substrate; a second process of adding a second element different from the first element to the first insulating film to form an amorphous second insulating film on the substrate; and a third process of annealing the second insulating film at a predetermined annealing temperature to be subjected to phase transition into a third insulating film. The addition concentration of the second element is controlled according to the annealing temperature. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011049531(A) |
申请公布日期 |
2011.03.10 |
申请号 |
JP20100146099 |
申请日期 |
2010.06.28 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
TAKEBAYASHI YUJI;YAMAZAKI HIROHISA;HORII SADAYOSHI;ITAYA HIDEJI;OGAWA ARIHITO |
分类号 |
H01L21/316;H01L21/31;H01L21/8242;H01L27/108 |
主分类号 |
H01L21/316 |
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地址 |
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