发明名称 Test and Measurement Instrument and Method For Providing Post-Acquisition Trigger Control and Presentation
摘要 A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display. An electrical signal under test is sampled and digitized, and stored in an acquisition memory as a data record. A display device draws a waveform associated with the signal under test. After the acquisition of the digital samples is stopped, a user selects trigger criteria using trigger controls such as a trigger level control. A trigger circuit detects a post-acquisition trigger event in the data record based on the trigger criteria causing an automatic adjustment of the waveform to conform to a time of the post-acquisition trigger event. One or more configurable trigger controls can be used to adjust a display of post-acquisition trigger events and waveforms. Upon resumption of the live-acquisition of data, the live waveform conforms to the newly selected trigger criteria as previewed during the post-acquisition mode.
申请公布号 US2011060541(A1) 申请公布日期 2011.03.10
申请号 US20090576045 申请日期 2009.10.08
申请人 TEKTRONIX, INC. 发明人 BARTLETT JOSIAH A.;VEITH KRISTIE L.;SULLIVAN STEVEN K.
分类号 G01R13/02 主分类号 G01R13/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利